Precision 3D Surface Metrology for Advanced Manufacturing
Surface Metrology at the Nanometre Scale
SENSOFAR 3D OPTICAL profilometers
Quantifying Surfaces Beyond the Limits of Conventional Optical Microscopes
Sensofar optical metrology systems allow engineers to measure and analyse structures in three dimensions, transforming microscopic surface features into precise quantitative data.
Why sensofar
Class Leading Areal Measurement
Sensofar systems deliver metrology-grade surface data.
By integrating multiple optical measurement technologies within a single platform, Sensofar systems allow engineers to analyse surface characteristics across a far wider range of materials and geometries than traditional optical instruments.
Key capabilities
Nanometre-scale vertical resolution
Nanometre-scale vertical resolution
Nanometre-scale vertical resolution
Non-contact optical surface measurement
Non-contact optical surface measurement
Non-contact optical surface measurement
Quantitative 3D surface topography
Quantitative 3D surface topography
Quantitative 3D surface topography
Measurement across smooth, rough and structured surfaces
Measurement across smooth, rough and structured surfaces
Measurement across smooth, rough and structured surfaces
Advanced Optical Measurement Technologies
Confocal microscopy for complex surface structures
Confocal microscopy for complex surface structures
Confocal microscopy for complex surface structures
Interferometry for ultra-smooth surfaces
Interferometry for ultra-smooth surfaces
Interferometry for ultra-smooth surfaces
Focus variation for steep or highly textured geometries
Focus variation for steep or highly textured geometries
Focus variation for steep or highly textured geometries
Precision Data for Engineering Decisions
Quantitative surface roughness analysis
Quantitative surface roughness analysis
Quantitative surface roughness analysis
Measurement of micro-scale surface features
Measurement of micro-scale surface features
Measurement of micro-scale surface features
High-resolution 3D surface mapping
High-resolution 3D surface mapping
High-resolution 3D surface mapping
AIET provides application support and supply of Sensofar Metrology Systems
Contact AIET to discuss deploying Sensofar optical profilometers within your organisation.
Nanometre-Scale Precision
Measure surface structure with extreme vertical resolution, revealing micro-features that directly influence performance, wear and reliability.
Nanometre-Scale Precision
Measure surface structure with extreme vertical resolution, revealing micro-features that directly influence performance, wear and reliability.
Nanometre-Scale Precision
Measure surface structure with extreme vertical resolution, revealing micro-features that directly influence performance, wear and reliability.
True 3D Surface Measurement
Capture full surface topography rather than simple images, enabling precise analysis of texture, geometry and micro-structure.
True 3D Surface Measurement
Capture full surface topography rather than simple images, enabling precise analysis of texture, geometry and micro-structure.
True 3D Surface Measurement
Capture full surface topography rather than simple images, enabling precise analysis of texture, geometry and micro-structure.
Multi-Technology Metrology
Confocal microscopy, interferometry and focus variation combine within one system to measure a wider range of surfaces with exceptional accuracy.
Multi-Technology Metrology
Confocal microscopy, interferometry and focus variation combine within one system to measure a wider range of surfaces with exceptional accuracy.
Multi-Technology Metrology
Confocal microscopy, interferometry and focus variation combine within one system to measure a wider range of surfaces with exceptional accuracy.
Engineering-Grade Surface Analysis
Generate precise, repeatable measurement data to support quality control, materials research and advanced manufacturing development.
Engineering-Grade Surface Analysis
Generate precise, repeatable measurement data to support quality control, materials research and advanced manufacturing development.
Engineering-Grade Surface Analysis
Generate precise, repeatable measurement data to support quality control, materials research and advanced manufacturing development.
Trusted by Market Leaders
Sensofar is trusted by leading organisations in semiconductor manufacturing, aerospace, precision engineering, medical devices and advanced materials research
Sensofar Optical Profilers
Simply Powerful
TREND
S NEOX
4-in-1 with Ai Focus Variation, Confocal, & Interferometry
4-in-1 with Ai Focus Variation, Confocal, & Interferometry
4-in-1 with Ai Focus Variation, Confocal, & Interferometry
Auto tip-tilt levelling
Auto tip-tilt levelling
Auto tip-tilt levelling
Motorised nose-piece with up to 6 objectives
Motorised nose-piece with up to 6 objectives
Motorised nose-piece with up to 6 objectives
Validated and calibrated to traceable standards
Validated and calibrated to traceable standards
Validated and calibrated to traceable standards
S neox optical profilometer outperforms existing optical 3D profiling microscopes in terms of performance, functionality, efficiency and design, providing class-leading areal measurement system.
Compact & Versatile
Vendor oversight
S LYNX 2
Powerful measuring techniques: Interferometry, Confocal & Ai Focus Variation
Powerful measuring techniques: Interferometry, Confocal & Ai Focus Variation
Powerful measuring techniques: Interferometry, Confocal & Ai Focus Variation
Compact system with large measurement area, spanning an impressive 125 x 75 mm
Compact system with large measurement area, spanning an impressive 125 x 75 mm
Compact system with large measurement area, spanning an impressive 125 x 75 mm
Fast acquisition with powerful PC processing
Fast acquisition with powerful PC processing
Fast acquisition with powerful PC processing
Easy focusing across varying sizes
Easy focusing across varying sizes
Easy focusing across varying sizes
Compact and versatile 3D optical system for roughness, volume, and critical dimensions measurements.
MAXIMUM VERSATILITY
TREND
S NEOX FIVE AXIS
Combine images for complete 3D volumetric measurement
Combine images for complete 3D volumetric measurement
Combine images for complete 3D volumetric measurement
Measure angles greater than 90º
Measure angles greater than 90º
Measure angles greater than 90º
Repeatable & traceable, according to NPL, NIST and PTB roughness standards.
Repeatable & traceable, according to NPL, NIST and PTB roughness standards.
Repeatable & traceable, according to NPL, NIST and PTB roughness standards.
360º of endless rotation
360º of endless rotation
360º of endless rotation
Combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S Neox.
SPOTLIGHT APPLICATION
Fast, flexible and reliable semiconductor metrology tools
Automation-ready tools across the semiconductor supply chain. Improve yield, boost throughput and improve quality
Fast, Non-Contact Measurement
Optical metrology captures high-resolution surface data without touching the wafer, enabling rapid inspection while protecting delicate micro-structures and thin layers.
Fast, Non-Contact Measurement
Optical metrology captures high-resolution surface data without touching the wafer, enabling rapid inspection while protecting delicate micro-structures and thin layers.
Fast, Non-Contact Measurement
Optical metrology captures high-resolution surface data without touching the wafer, enabling rapid inspection while protecting delicate micro-structures and thin layers.
Thin-Film and Surface Precision
Measure critical semiconductor parameters including film thickness, step height and surface roughness with nanometre-level accuracy, ensuring optimal device performance and process consistency.
Thin-Film and Surface Precision
Measure critical semiconductor parameters including film thickness, step height and surface roughness with nanometre-level accuracy, ensuring optimal device performance and process consistency.
Thin-Film and Surface Precision
Measure critical semiconductor parameters including film thickness, step height and surface roughness with nanometre-level accuracy, ensuring optimal device performance and process consistency.
Process Control for Advanced Manufacturing
Quantitative 3D metrology enables engineers to monitor etch profiles, surface structures and wafer features, maintaining tight tolerances across semiconductor fabrication processes.
Process Control for Advanced Manufacturing
Quantitative 3D metrology enables engineers to monitor etch profiles, surface structures and wafer features, maintaining tight tolerances across semiconductor fabrication processes.
Process Control for Advanced Manufacturing
Quantitative 3D metrology enables engineers to monitor etch profiles, surface structures and wafer features, maintaining tight tolerances across semiconductor fabrication processes.
Frequently asked questions
Answers to common questions about Sensofar 3D Optical Profilometers
Schedule a call
Let’s talk about your application and how AIET Group can help you.
Do you prefer email? We're available at:
Schedule a call
Let’s talk about your application and how AIET Group can help you.
Do you prefer email? We're available at:
Schedule a call
Let’s talk about your application and how AIET Group can help you.
Do you prefer email? We're available at:
Optical surface metrology measures the micro- and nano-scale structure of a surface without physical contact. Using advanced optical techniques, engineers can capture precise 3D topography data to analyse roughness, thickness, defects and micro-geometry.
Sensofar systems are widely used in semiconductor manufacturing, microelectronics, optics, medical devices, precision engineering and advanced materials research where accurate surface measurement is critical.
Modern semiconductor devices require extremely tight tolerances. Metrology ensures wafer structures, film thickness and micro-features remain within specification, helping manufacturers control processes, reduce defects and improve yield.
Sensofar systems combine multiple optical techniques including confocal microscopy, interferometry and focus variation to measure surfaces with nanometre-scale resolution across a wide range of materials and geometries.
Optical profilometers can measure smooth, rough, reflective or structured surfaces. Typical measurements include surface roughness, thin films, step heights, micro-features and complex topographies across precision components.
Yes. Many Sensofar systems are used for industrial quality control and process monitoring. Automated measurement workflows allow engineers to analyse surfaces quickly while maintaining extremely high measurement accuracy.
Sensofar metrology systems are used in universities, research institutes, semiconductor research programmes and advanced manufacturing facilities across the UAE and Middle East. Typical users include materials science labs, semiconductor R&D groups and precision engineering organisations.
Selecting the correct system depends on the surface type, measurement range, resolution requirements and application. AIET provides consultation and application guidance to help organisations deploy the most appropriate Sensofar metrology solution.
Optical surface metrology measures the micro- and nano-scale structure of a surface without physical contact. Using advanced optical techniques, engineers can capture precise 3D topography data to analyse roughness, thickness, defects and micro-geometry.
Sensofar systems are widely used in semiconductor manufacturing, microelectronics, optics, medical devices, precision engineering and advanced materials research where accurate surface measurement is critical.
Modern semiconductor devices require extremely tight tolerances. Metrology ensures wafer structures, film thickness and micro-features remain within specification, helping manufacturers control processes, reduce defects and improve yield.
Sensofar systems combine multiple optical techniques including confocal microscopy, interferometry and focus variation to measure surfaces with nanometre-scale resolution across a wide range of materials and geometries.
Optical profilometers can measure smooth, rough, reflective or structured surfaces. Typical measurements include surface roughness, thin films, step heights, micro-features and complex topographies across precision components.
Yes. Many Sensofar systems are used for industrial quality control and process monitoring. Automated measurement workflows allow engineers to analyse surfaces quickly while maintaining extremely high measurement accuracy.
Sensofar metrology systems are used in universities, research institutes, semiconductor research programmes and advanced manufacturing facilities across the UAE and Middle East. Typical users include materials science labs, semiconductor R&D groups and precision engineering organisations.
Selecting the correct system depends on the surface type, measurement range, resolution requirements and application. AIET provides consultation and application guidance to help organisations deploy the most appropriate Sensofar metrology solution.
Optical surface metrology measures the micro- and nano-scale structure of a surface without physical contact. Using advanced optical techniques, engineers can capture precise 3D topography data to analyse roughness, thickness, defects and micro-geometry.
Sensofar systems are widely used in semiconductor manufacturing, microelectronics, optics, medical devices, precision engineering and advanced materials research where accurate surface measurement is critical.
Modern semiconductor devices require extremely tight tolerances. Metrology ensures wafer structures, film thickness and micro-features remain within specification, helping manufacturers control processes, reduce defects and improve yield.
Sensofar systems combine multiple optical techniques including confocal microscopy, interferometry and focus variation to measure surfaces with nanometre-scale resolution across a wide range of materials and geometries.
Optical profilometers can measure smooth, rough, reflective or structured surfaces. Typical measurements include surface roughness, thin films, step heights, micro-features and complex topographies across precision components.
Yes. Many Sensofar systems are used for industrial quality control and process monitoring. Automated measurement workflows allow engineers to analyse surfaces quickly while maintaining extremely high measurement accuracy.
Sensofar metrology systems are used in universities, research institutes, semiconductor research programmes and advanced manufacturing facilities across the UAE and Middle East. Typical users include materials science labs, semiconductor R&D groups and precision engineering organisations.
Selecting the correct system depends on the surface type, measurement range, resolution requirements and application. AIET provides consultation and application guidance to help organisations deploy the most appropriate Sensofar metrology solution.
